I. Cevdet Noyan


Office: 1120 S.W. Mudd
Mail: 200 Mudd, Mail Code 4701
New York, NY 10027

Tel(212) 854-8919
Fax(212) 854-8257

I. Cevdet Noyan has been studying the mechanical response of crystalline materials over various length scales using diffraction since 1978. He was one of the first researchers to combine the theory of micromechanics with that of x-ray and neutron diffraction. He and his group develop x-ray and neutron characterization techniques for non-destructive analysis of structures, with applications spanning suspension bridge cables, integrated circuits, and nanostructures. Noyan and his co-workers also work on the theory of scattering, with particular emphasis on defining the information volumes from which diffraction data are measured, and quantification of the uncertainties associated with such data. 

Research Interests

characterization and modeling of mechanical and micromechanical deformation; residual stress analysis and nondestructive testing; x-ray and neutron diffraction, microdiffraction analysis

Research Areas


Noyan received his B.S. in Metallurgical Engineering from the Middle East Technical University in Ankara, Turkey, in 1978 and his Ph.D. in Materials Science and Engineering from Northwestern University in 1984. His early research work was at IBM, where he received two IBM Outstanding Technical Achievement Awards for research and development of computer and packaging structures, an IBM Research Division Award for research on diffusion barriers, and 11 IBM Invention Plateaus for filed patents. He is also coauthor of the monograph, Residual Stress: Measurement by Diffraction and Interpretation (Materials Research and Engineering).

Prof. Noyan is a member of the organizing committee of the Denver X-ray Conference and co-editor of the Advances in X-Ray Analysis. He is a fellow of the American Physical Society. He has received the Blackall Machine Tool and Gage Award from the American Society of Mechanical Engineers in 2006, and the Jenkins Lifetime Achievement (2015) and Hanawalt (2019) awards from the International Centre for Diffraction Data.


Columbia University, New York, NY

  • APAM Department Chair (July 2012 - June 2018)
  • Professor of Materials Science and Engineering (2004 - Present)
  • Adjunct Professor (1985 - 2004)


International Business Machines Corporation, Yorktown Heights, NY

  • Research Consultant (2004 - 2017)
  • Research Staff Member (1985 - 2004)


  • Fellow, American Physical Society
  • Member ASM, TMS-AIME, ACA, APS, Sigma Xi, IEEE, ICDD
  • Organizing Board Member, responsible for residual stress issues, Denver X-ray Conference


  • Jenkins Lifetime Achievement Award, International Centre for Diffraction Data, 2015
  • Blackall Machine Tool and Gage Award, American Society of Mechanical Engineers, 2006
  • Two IBM Outstanding Technical Achievement Awards for research and development of computer and packaging structures
  • IBM Research Division Award for research on diffusion barriers and 11 IBM Invention Plateaus for filed patents
  • Adjunct Faculty Award for excellence in teaching, Columbia University, 1993


“Average and local strain fields in nanocrystals”, S. Xiong, S.-Y. Lee and I. C. Noyan, J. Appl. Cryst. 52, 2019

“The nanodiffraction problem”, S. Xiong, H. Öztürk, S.-Y. Lee, P. M. Mooney and I. C. Noyan, J. Appl. Cryst. 51, 2018

“Expected values and variances of Bragg peak intensities measured in a nanocrystalline powder diffraction experiment”, H. Öztürk and I. C. Noyan, J. Appl. Cryst. 50, 2017

“Performance evaluation of Bragg coherent diffraction imaging”, H. Öztürk, X. Huang, H. Yan, I. K. , I. C. Noyan and Y. S. Chu, New Journal of Physics, 19, 2017 (https://iopscience.iop.org/article/10.1088/1367-2630/aa83a9/meta )

“Partitioning of Clamping Strains in a Nineteen Parallel Wire Strand”, A. Brügger, S.-Y. Lee, J. A. A. Mills, R. Betti, I.C. Noyan, Experimental Mechanics 57, 2017

“Stress measurement using area detectors: a theoretical and experimental comparison of different methods in ferritic steel using a portable X-ray apparatus”, J. Ramirez-Rico, S.-Y. LeeJ. J. Ling, I. C. Noyan, Journal of Materials Science, 51, 2016